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19 April 2024
 
  » arxiv » 0709.2615

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Bulk Cr tips for STM and Spin-Polarized STM
A. Li Bassi ; C. S. Casari ; D. Cattaneo ; F. Donati ; S. Foglio ; M. Passoni ; C. E. Bottani ; P. Biagioni ; A. Brambilla ; M. Finazzi ; F. Ciccacci ; L. Duo' ;
Date 17 Sep 2007
AbstractA simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si(111)-7x7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.
Source arXiv, 0709.2615
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