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25 April 2024 |
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Valence band x-ray emission spectra of compressed germanium | | Viktor V Struzhkin
; Ho-kwang Mao
; Jung-Fu Lin
; Russell J Hemley
; John S Tse
; Yanming Ma
; Michael Y Hu
; Paul Chow
; Chi-Chang Kao
; | | Date: |
7 Apr 2006 | | Journal: | Phys Rev Lett, 96 (13), 137402 | | Abstract: | We report measurements of the valence band width in compressed Ge determined from x-ray emission spectra below the Ge K edge. The width of the valence band does not show any pressure dependence in the semiconducting diamond-type structure of Ge below 10 GPa. On the other hand, in the metallic beta-Sn phase above 10 GPa the valence band width increases under compression. Density-functional calculations show an increasing valence band width under compression both in the semiconducting phase (contrary to experiment) and in the metallic beta-Sn phase of Ge (in agreement with observed pressure-induced broadening). The pressure-independent valence band width in the semiconducting phase of Ge appears to require theoretical advances beyond the density-functional theory or the GW approximation. | | Source: | PubMed, pmid16712032 | | Services: | Forum | Review | Favorites | |
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