Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3643
Articles: 2'487'895
Articles rated: 2609

28 March 2024
 
  » pubmed » pmid16383624

 Article overview


Test of clock model in ellipsometric study of thin and thick free-standing films of an antiferroelectric liquid crystal
M Conradi ; M Cepic ; M Copic ; I Musevic ;
Date 31 Oct 2005
Journal Phys Rev E, 72 (5 Pt 1), 051711
AbstractThe temperature dependences of the ellipsometric parameters in a weak dc external field are studied in thin and thick free-standing films of MHPOBC. The results for thin films consisting of two, three, and four layers are analyzed within the discrete phenomenological model. We find very good quantitative agreement between the theory and experiment, which indicates an odd-even effect. We find that the XY structures are stable for an odd number of layers, whereas planar, Ising-like structures are stable for an even number of layers. The experiments on thick (several tens of layers) films show a combination of bulklike and free-surface behavior. This is most pronounced at high temperatures, where the interior of the film is not tilted, whereas the layers at the air interfaces show qualitatively similar temperature dependance of the ellipsometric parameters as in the four-layer film.
Source PubMed, pmid16383624
Services Forum | Review | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser claudebot






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica