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X-ray reflectivity study on the surface and bulk glass transition of polystyrene | R Weber
; K M Zimmermann
; M Tolan
; J Stettner
; W Press
; O H Seeck
; J Erichsen
; V Zaporojtchenko
; T Strunskus
; F Faupel
; | Date: |
30 Nov 2001 | Journal: | Phys Rev E, 64 (6 Pt 1), 061508 | Abstract: | The surfaces of polystyrene (PS) films decorated with gold nanoclusters were investigated by x-ray reflectivity measurements. The thicknesses of the films are much larger than the radii of gyration of the different PS samples. By annealing the films above the glass transition temperature T(g) an embedding process of the clusters into the polymer is detected which is accompanied by a substantial increase in the cluster layer thickness due to Brownian motion. These processes start at a sufficiently low viscosity and may be regarded as a probe of the glass transition in the near surface region of the PS films. Simultaneously the thermal expansion of the entire film and hence its approximate bulk behavior were monitored. Two samples of different molecular weight do not show a significant difference between the surface and bulk T(g) values. | Source: | PubMed, pmid11736192 | Services: | Forum | Review | Favorites |
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