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Scaling of 1/f noise in tunable break-junctions | | ZhengMing Wu
; SongMei Wu
; S. Oberholzer
; M. Steinacher
; M. Calame
; C. Schönenberger
; | | Date: |
28 Sep 2008 | | Abstract: | We have studied the $1/f$ voltage noise of gold nano-contacts in
electromigrated and mechanically controlled break-junctions having resistance
values $R$ that can be tuned from 10 $Omega$ (many channels) to 10 k$Omega$
(single atom contact). The noise is caused by resistance fluctuations as
evidenced by the $S_Vpropto V^2$ dependence of the power spectral density
$S_V$ on the applied DC voltage $V$. As a function of $R$ the normalized noise
$S_V/V^2$ shows a pronounced cross-over from $propto R^3$ for low-ohmic
junctions to $propto R^{1.5}$ for high-ohmic ones. The measured powers of 3
and 1.5 are in agreement with $1/f$-noise generated in the bulk and reflect the
transition from diffusive to ballistic transport. | | Source: | arXiv, 0809.4841 | | Services: | Forum | Review | PDF | Favorites | |
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