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25 April 2024
 
  » arxiv » 1107.3427

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Development of a low cost, high resolution position detection system for photonic force microscopy
Sambit Bikas Pal ; Arijit Haldar ; Basudev Roy ; Ayan Banerjee ;
Date 18 Jul 2011
AbstractA photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. In this paper, we report the use of the optical pick-up head of a compact disc player as an extremely low cost yet accurate position sensor for photonic force microscopy. The size of the quadrant photo-IC in the pick-up head makes it ideal to work with a 1:1 image of a micron-sized probe in the microscope back-focal plane after the standard magnification by the trapping objective lens. This is an advantage over most commercial quadrant photodiodes or position sensitive detectors where it is difficult to image only the probe since such detectors require larger beams. This warrants external magnification optics leading to losses that may be significant in back-focal plane detection where the signal level directly off the probe is already very weak. Using a commercially available spare pick-up head, we demonstrate that the detector could measure absolute displacements with a resolution of $sim$10 nm over a bandwidth of 10 Hz at 95% significance without any sample or laser stabilization. It has a linear response range of around 385 nm with crosstalk between axes $simeq 4$% for optically trapped 1.1 {$ m mu$}m beads. We characterized our optical trap for different sizes beads and found that for 1.1 $mu$ diameter beads, the noise in our position measurement matched the thermal resolution limit for an averaging time of 10 ms. The detector is fast, of small size and low cost - factors that can lead to it’s widespread use in photonic force microscopy.
Source arXiv, 1107.3427
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