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New experimental evidence for the role of long-range potential fluctuations in the mechanism of 1/f noise in a-Si:H | J. P. R. Bakker
; P. J. S. van Capel
; B. V. Fine
; J. I. Dijkhuis
; | Date: |
20 Oct 2003 | Journal: | J. Non-Cryst. Solids, v.338-340, p.310 (2004) | Subject: | Disordered Systems and Neural Networks | cond-mat.dis-nn | Abstract: | We present measurements of 1/f resistance noise in three different films of amorphous silicon (a-Si) in the presense of a transverse electric current. Two of these films have n-i-n sandwich structure - in one of them all three layers were hydrogenated; in the other one only the n-layers were hydrogenated, while the intrinsic layer was deuterated. The third film had p-i-p structure with all three layers hydrogenated. The experimental spectra were found to be in a very good quantitative agreement with theoretical predictions, which were based on the mechanism involving long-range fluctuations of the Coulomb potential created by charged defects (see cond-mat/0210680). | Source: | arXiv, cond-mat/0310468 | Services: | Forum | Review | PDF | Favorites |
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