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Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As | | B. J. Kirby
; J. A. Borchers
; J. J. Rhyne
; S. G. E. te Velthuis
; A. Hoffmann
; K. V. O’Donovan
; T. Wojtowicz
; X. Liu
; W. L. Lim
; J. K. Furdyna
; | | Date: |
6 Nov 2003 | | Subject: | Materials Science | cond-mat.mtrl-sci | | Affiliation: | 2 and 5), T. Wojtowicz (6 and 7), X. Liu , W. L. Lim , J. K. Furdyna ( University of Missouri, NIST Center for Neutron Research, Los Alamos National Laboratory, Argonne National Laboratory, University of Maryland, Institute of Physics of the Pol | | Abstract: | We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films. | | Source: | arXiv, cond-mat/0311119 | | Services: | Forum | Review | PDF | Favorites | |
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