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Research and Development of Commercially Manufactured Large GEM Foils | | M. Posik
; B. Surrow
; | | Date: |
26 Nov 2014 | | Abstract: | The recently completed Forward GEM Tracker (FGT) of the STAR experiment at
RHIC took advantage of commercially produced GEM foils based on double-mask
chemical etching techniques. With future experiments proposing detectors that
utilize very large-area GEM foils, there is a need for commercially available
GEM foils. Double-mask etching techniques pose a clear limitation in the
maximum size. In contrast, single-mask techniques developed at CERN would allow
one to overcome those limitations. We report on results obtained using 10
$ imes$ 10 cm$^2$ and 40$ imes$40 cm$^2$ GEM foils produced by Tech-Etch Inc.
of Plymouth, MA, USA using single-mask techniques and thus the beginning for
large GEM foil production on a commercial basis. A quality assurance procedure
has been established through electrical and optical analyses via leakage
current measurements and an automated high-resolution CCD scanner. The
Tech-Etch foils show excellent electrical properties with leakage currents
typically measured below 1 nA. The geometrical properties of the Tech-Etch
single-mask foils were found to be consistent with one another, and were in
line with geometrical specifications from previously measured double-mask
foils. The single-mask foils displayed good inner and outer hole diameter
uniformities over the entire active area. | | Source: | arXiv, 1411.7243 | | Other source: | [GID 1622022] 1506.3652 | | Services: | Forum | Review | PDF | Favorites | |
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