Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3643
Articles: 2'488'730
Articles rated: 2609

29 March 2024
 
  » arxiv » 1412.8387

 Article overview


Site Selectivity on Chalcogen Atoms in Superconducting La(O,F)BiSSe
Masashi Tanaka ; Takuma Yamaki ; Yoshitaka Matsushita ; Masaya Fujioka ; Saleem J. Denholme ; Takahide Yamaguchi ; Hiroyuki Takeya ; Yoshihiko Takano ;
Date 29 Dec 2014
AbstractSingle crystals of La(O,F)BiSSe were successfully grown by a CsCl flux method. Single crystal X-ray structural analysis revealed that the crystal structure is isostructural with BiS$_2$- or BiSe$_2$-based compounds with space group $P4/nmm$ (lattice parameters $a$ = 4.1110(2) {AA}, $c$ = 13.6010(7) {AA}). However, the S atoms are selectively occupied at the apical site of the Bi-SSe pyramids in the superconducting layer. The single crystals show a superconducting transition at 4.2 K in the magnetic susceptibility and resistivity measurement. The superconducting anisotropic parameter is determined to be 34 from its upper critical magnetic field. The anisotropy is in the same range with that of other members of the La(O,F)BiCh$_2$ ($Ch$ = S, Se) family under ambient pressure.
Source arXiv, 1412.8387
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser claudebot






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica