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Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy | | Joseph L. Garrett
; Jeremy N. Munday
; | | Date: |
11 Jan 2016 | | Abstract: | Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to
measure electric potential on surfaces at nanometer length scales. Here we
demonstrate that Heterodyne-KPFM enables scan rates of several frames per
minute in air, and concurrently maintains spatial resolution and voltage
sensitivity comparable to frequency-modulation KPFM, the current spatial
resolution standard. Two common classes of topography-coupled artifacts are
shown to be avoidable with H-KPFM. A second implementation of H-KPFM is also
introduced, in which the voltage signal is amplified by the first cantilever
resonance for enhanced sensitivity. | | Source: | arXiv, 1601.2503 | | Services: | Forum | Review | PDF | Favorites | |
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