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28 March 2024 |
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Article overview
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Directly characterizing the relative strength and momentum dependence of electron-phonon coupling using resonant inelastic x-ray scattering | T. P. Devereaux
; A. M. Shvaika
; K. Wu
; K. Wohlfeld
; C. J. Jia
; Y. Wang
; B. Moritz
; L. Chaix
; W.-S. Lee
; Z.-X. Shen
; G. Ghiringhelli
; L. Braicovich
; | Date: |
10 May 2016 | Abstract: | The coupling between lattice and charge degrees of freedom in condensed
matter materials is ubiquitous and can often result in interesting properties
and ordered phases, including conventional superconductivity, charge density
wave order, and metal-insulator transitions. Angle-resolved photoemission
spectroscopy and both neutron and non-resonant x-ray scattering serve as
effective probes for determining the behavior of appropriate, individual
degrees of freedom -- the electronic structure and lattice excitation, or
phonon dispersion, respectively. However, each provides less direct information
about the mutual coupling between the degrees of freedom, usual through
self-energy effects, which tend to renormalize and broaden spectral features
precisely where the coupling is strong, impacting ones ability to quantitively
characterize the coupling. Here we demonstrate that resonant inelastic x-ray
scattering, or RIXS, can be an effective tool to directly determine the
relative strength and momentum dependence of the electron-phonon coupling in
condensed matter systems. Using a diagrammatic approach for an 8-band model of
copper oxides, we study the contributions from the lowest order diagrams to the
full RIXS intensity for a realistic scattering geometry, accounting for matrix
element effects in the scattering cross-section as well as the momentum
dependence of the electron-phonon coupling vertex. A detailed examination of
these maps offers a unique perspective into the characteristics of
electron-phonon coupling, which complements both neutron and non-resonant x-ray
scattering, as well as Raman and infrared conductivity. | Source: | arXiv, 1605.3129 | Services: | Forum | Review | PDF | Favorites |
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