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Article overview
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Overcoming artifacts and instabilities in multifrequency atomic force microscopy methods using tip dynamics | | Joseph L. Garrett
; Lisa J. Krayer
; Kevin J. Palm
; Jeremy N. Munday
; | | Date: |
19 Apr 2017 | | Abstract: | In atomic force microscopy (AFM), the angle relative to the vertical
($ heta_{i}$) that the tip apex of a cantilever moves is determined by the
tilt of the probe holder and the geometries of the cantilever and actuated
eigenmode $i$. Even though the effects of $ heta_{i}$ on static and
single-frequency AFM are known (increased effective spring constant,
sensitivity to sample anisotropy, etc), the higher eigenmodes used in
multifrequency force microscopy lead to additional effects that have not been
fully explored. Here we use bimodal AFM and Kelvin probe force microscopy
(KPFM) to investigate how $ heta_{i}$ affects not only the signal amplitude
and phase, but can also lead to new behaviors such as destabilization of the
KPFM voltage feedback loop. We find that longer cantilevers and modified sample
orientations improve voltage feedback loop stability, even though variations to
scanning parameters such as cantilever shake amplitude and lift height do not. | | Source: | arXiv, 1704.5736 | | Services: | Forum | Review | PDF | Favorites | |
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