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19 April 2024 |
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Article overview
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Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing | Jonathan Schwartz
; Yi Jiang
; Yongjie Wang
; Anthony Aiello
; Pallab Bhattacharya
; Hui Yuan
; Zetian Mi
; Nabil Bassim
; Robert Hovden
; | Date: |
23 Jan 2019 | Abstract: | Highly-directional image artifacts such as ion mill curtaining, mechanical
scratches, or image striping from beam instability degrade the interpretability
of micrographs. These unwanted, aperiodic features extend the image along a
primary direction and occupy a small wedge of information in Fourier space.
Deleting this wedge of data replaces stripes, scratches, or curtaining, with
more complex streaking and blurring artifacts-known within the tomography
community as missing wedge artifacts. Here, we overcome this problem by
recovering the missing region using total variation minimization, which
leverages image sparsity based reconstruction techniques-colloquially referred
to as compressed sensing-to reliably restore images corrupted by stripe like
features. Our approach removes beam instability, ion mill curtaining,
mechanical scratches, or any stripe features and remains robust at low
signal-to-noise. The success of this approach is achieved by exploiting
compressed sensings inability to recover directional structures that are highly
localized and missing in Fourier Space. | Source: | arXiv, 1901.8001 | Services: | Forum | Review | PDF | Favorites |
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