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25 April 2024

» arxiv » 1903.5009

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Signature of a surface magnetic disorder in epitaxial TiN films
N.A. Tovpeko ; N.A. Titova ; E.M. Baeva ; A.V. Semenov ; S. Saha ; H. Reddy ; S. Bogdanov ; E.E. Marinero ; V.M. Shalaev ; A. Boltasseva ; V.S. Khrapai ; A.I. Kardakova ; G.N. Goltsman ;
Date:	12 Mar 2019
Abstract:	We analyze the evolution of the normal and superconducting electronic properties in epitaxial TiN films as a function of the film thickness with high Ioffe-Regel parameter values. As the film thickness decreases, we observe an increase of in the residual resistivity, which becomes dominated by diffusive surface scattering for $dleq20,$nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such a high quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of $sim10^{12},mathrm{cm}^{-2}$. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films.
Source:	arXiv, 1903.5009
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