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Article overview
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Study of microwave resonances induced by bias lines of shunted Josephson junctions | | Ugur Yilmaz
; Sasan Razmkhah
; Romain Collot
; Juergen Kunert
; Ronny Stolz
; Pascal Febvre
; | | Date: |
1 Dec 2019 | | Abstract: | Bias lines routed over a ground plane naturally form microstrip lines
associated with the presence of a capacitance. This can lead to unwanted
resonances when coupled to Josephson junctions. This work presents an
electrical model of a shunted Josephson junction with its bias lines and pads,
fabricated with the 1 kA/cm$^2$ RSFQ niobium process of the FLUXONICS Foundry.
A compact LCL T-model is used to simulate the microwave behavior of the bias
line, predict resonances and design resonance-free superconducting circuits.
The I-V characteristics of three shunted Josephson junctions have been obtained
from time-domain simulations done with JSIM and show a good match with the
global behavior and experimentally observed resonance at 230 GHz, measured at
4.2 K. The influence of the position and value of a series resistor placed on
bias lines is studied to damp unwanted resonances at the junction. | | Source: | arXiv, 1912.0503 | | Services: | Forum | Review | PDF | Favorites | |
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