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24 April 2024 |
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Article overview
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Radiation hardness study for the COMET Phase-I electronics | | Yu Nakazawaa
; Yuki Fujii
; Ewen Gillies
; Eitaro Hamada
; Youichi Igarashi
; MyeongJae Lee
; Manabu Moritsu
; Yugo Matsuda
; Yuta Miyazaki
; Yuki Nakai
; Hiroaki Natori
; Kou Oishi
; Akira Sato
; Yoshi Uchida
; Kazuki Ueno
; Hiroshi Yamaguchi
; BeomKi Yeo
; Hisataka Yoshida
; Jie Zhang
; | | Date: |
4 Dec 2019 | | Abstract: | Radiation damage on front-end readout and trigger electronics is an important
issue in the COMET Phase-I experiment at J-PARC, which plans to search for the
neutrinoless transition of a muon to an electron. To produce an intense muon
beam, a high-power proton beam impinges on a graphite target, resulting in a
high-radiation environment. We require radiation tolerance to a total dose of
$1.0,mathrm{kGy}$ and $1,mathrm{MeV}$ equivalent neutron fluence of
$1.0 imes10^{12},mathrm{n_{eq},cm^{-2}}$ including a safety factor of 5
over the duration of the physics measurement. The use of commercially-available
electronics components which have high radiation tolerance, if such components
can be secured, is desirable in such an environment. The radiation hardness of
commercial electronic components has been evaluated in gamma-ray and neutron
irradiation tests. As results of these tests, voltage regulators, ADCs, DACs,
and several other components were found to have enough tolerance to both
gamma-ray and neutron irradiation at the level we require. | | Source: | arXiv, 1912.1742 | | Services: | Forum | Review | PDF | Favorites | |
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