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25 April 2024
 
  » arxiv » 1912.7254

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VLSI Mask Optimization: From Shallow To Deep Learning
Haoyu Yang ; Wei Zhong ; Yuzhe Ma ; Hao Geng ; Ran Chen ; Wanli Chen ; Bei Yu ;
Date 16 Dec 2019
AbstractVLSI mask optimization is one of the most critical stages in manufacturability aware design, which is costly due to the complicated mask optimization and lithography simulation. Recent researches have shown prominent advantages of machine learning techniques dealing with complicated and big data problems, which bring potential of dedicated machine learning solution for DFM problems and facilitate the VLSI design cycle. In this paper, we focus on a heterogeneous OPC framework that assists mask layout optimization. Preliminary results show the efficiency and effectiveness of proposed frameworks that have the potential to be alternatives to existing EDA solutions.
Source arXiv, 1912.7254
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