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23 April 2024
 
  » arxiv » 2002.7771

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Point process convergence for the off-diagonal entries of sample covariance matrices
Johannes Heiny ; Thomas Mikosch ; Jorge Yslas ;
Date 18 Feb 2020
AbstractWe study point process convergence for sequences of iid random walks. The objective is to derive asymptotic theory for the extremes of these random walks. We show convergence of the maximum random walk to the Gumbel distribution under the existence of a $(2+delta)$th moment. We make heavily use of precise large deviation results for sums of iid random variables. As a consequence, we derive the joint convergence of the off-diagonal entries in sample covariance and correlation matrices of a high-dimensional sample whose dimension increases with the sample size. This generalizes known results on the asymptotic Gumbel property of the largest entry.
Source arXiv, 2002.7771
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