Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'504'928
Articles rated: 2609

25 April 2024
 
  » arxiv » cond-mat/0409046

 Article overview



Radio-frequency operation of a double-island single-electron transistor
R. Brenner ; T.M. Buehler ; D.J. Reilly ;
Date 2 Sep 2004
Subject Other | cond-mat.other
AbstractWe present results on a double-island single-electron transistor (DISET) operated at radio-frequency (rf) for fast and highly sensitive detection of charge motion in the solid state. Using an intuitive definition for the charge sensitivity, we compare a DISET to a conventional single-electron transistor (SET). We find that a DISET can be more sensitive than a SET for identical, minimum device resistances in the Coulomb blockade regime. This is of particular importance for rf operation where ideal impedance matching to 50 Ohm transmission lines is only possible for a limited range of device resistances. We report a charge sensitivity of 5.6E-6 e/sqrt(Hz) for a rf-DISET, together with a demonstration of single-shot detection of small (<=0.1e) charge signals on microsecond timescales.
Source arXiv, cond-mat/0409046
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica