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The Simons Observatory: Metamaterial Microwave Absorber (MMA) and its Cryogenic Applications | Zhilei Xu
; Grace E. Chesmore
; Shunsuke Adachi
; Aamir M. Ali
; Andrew Bazarko
; Gabriele Coppi
; Mark Devlin
; Ted Devlin
; Simon R. Dicker
; Patricio A. Gallardo
; Joseph E. Golec
; Jon E. Gudmundsson
; Kathleen Harrington
; Makoto Hattori
; Anna Kofman
; Kenji Kiuchi
; Akito Kusaka
; Michele Limon
; Frederick Matsuda
; Jeff McMahon
; Federico Nati
; Michael D. Niemack
; Aritoki Suzuki
; Grant P. Teply
; Robert J. Thornton
; Edward J. Wollack
; Mario Zannoni
; Ningfeng Zhu
; | Date: |
5 Oct 2020 | Abstract: | In modern microwave astrophysics instrumentation, system noise is dominated
by statistical photon noise. The photon noise can be reduced by terminating
stray light paths at cryogenic instead of room temperatures. Controlling stray
light at millimeter wavelengths requires careful optical design and selection
of absorptive materials, which must be compatible with the cryogenic operating
environment. While a wide selection of absorptive materials exists, these
typically exhibit high indices of refraction, which reflect/scatter a
significant fraction of light before the light can be absorbed. For many lower
index materials such as commercial microwave absorbers, applications in
cryogenic environments require overcoming a variety of challenges. In this
paper we present a new tool to control stray light: metamaterial microwave
absorber (MMA) tiles. These MMA tiles are comprised of an outer metamaterial
layer, which approximates a gradient index anti-reflection coating. They are
fabricated via injection molding carbon loaded polyurethane (25% by mass). The
injection molding technology enables mass production at low cost. The design of
these tiles is presented, along with the measurements demonstrating efficient
cooling to 1K. We measured their optical performance at room temperature.
Measurements verify control of reflectance to less than 1% up to 65$^{circ}$
angles of incidence, and control of wide-angle scattering below 0.01%. The
dielectric properties of the material were also measured, confirming that the
material maintains similar dielectric properties down to 3K. | Source: | arXiv, 2010.02233 | Services: | Forum | Review | PDF | Favorites |
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