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24 April 2024 |
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Type inversion in irradiated silicon: a half truth | | M. Swartz
; D. Bortoletto
; V. Chiochia
; L. Cremaldi
; S. Cucciarelli
; A. Dorokhov
; M. Konecki
; K. Prokofiev
; C. Regenfus
; T. Rohe
; D. A. Sanders
; S. Son
; T. Speer
; | | Date: |
9 Sep 2004 | | Subject: | Instrumentation and Detectors | physics.ins-det hep-ex | | Affiliation: | 3 and 6), M. Konecki , K. Prokofiev (3 and 6), C. Regenfus , T. Rohe , D. A. Sanders , S. Son , T. Speer ( Johns Hopkins University, Purdue University, Physik Institut der Universitaet Zuerich-Irchel, University of Mississippi, Institut fuer Phys | | Abstract: | Charge collection measurements performed on heavily irradiated p-spray dofz pixel sensors with a grazing angle hadron beam provide a sensitive determination of the electric field within the detectors. The data are compared with a complete charge transport simulation of the sensor which includes signal trapping and charge induction effects. A linearly varying electric field based upon the standard picture of a constant type-inverted effective doping density is inconsistent with the data. A two-trap double junction model implemented in ISE TCAD software can be tuned to produce a doubly-peaked electric field which describes the data reasonably well at two different fluences. The modeled field differs somewhat from previous determinations based upon the transient current technique. The model can also account for the level of signal trapping observed in the data. | | Source: | arXiv, physics/0409049 | | Services: | Forum | Review | PDF | Favorites | |
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