Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'501'711
Articles rated: 2609

20 April 2024
 
  » arxiv » cond-mat/0503272

 Article overview


Raman scattering in osmium under pressure
Yu. S. Ponosov ; I. Loa ; V. E. Mogilenskikh ; K. Syassen ;
Date 11 Mar 2005
Subject Other | cond-mat.other
AbstractThe effect of pressure and temperature on the Raman-active phonon mode of osmium metal has been investigated for pressures up to 20 GPa and temperatures in the range 10--300 K. Under hydrostatic conditions (He pressure medium) the phonon frequency increases at a rate of 0.73(5) cm^{-1}/GPa (T = 300 K). A large temperature-induced and wavelength-dependent frequency shift of the phonon frequency is observed, of which only a small fraction can be associated with the thermal volume change. The main contribution to the temperature dependence of the phonon frequency is rather attributed to non-adiabatic effects in the electron-phonon interaction, which explains also the observation of an increasing phonon line width upon cooling. The phonon line width and the pressure-induced frequency shift were found to be unusually sensitive to shear stress.
Source arXiv, cond-mat/0503272
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica