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Sub-wavelength imaging at optical frequencies using canalization regime | Pavel A. Belov
; Yang Hao
; | Date: |
20 Sep 2005 | Subject: | Materials Science | cond-mat.mtrl-sci | Abstract: | Imaging with sub-wavelength resolution using a lens formed by periodic metal-dielectric layered structure is demonstrated. The lens operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the lens have to be an integer number of half-wavelengths and can be made as large as required for ceratin applications, in contrast to the other sub-wavelength lenses formed by metallic slabs which have to be much smaller than the wavelength. Resolution of $lambda/20$ at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a periodic stack of 10 nm layers of glass with $epsilon=2$ and 5 nm layers of metal-dielectric composite with $epsilon=-1$. Resolution of $lambda/60$ is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76 nm layers of silicon with $epsilon=15$ and 7.24 nm layers of silver with $epsilon=-14$. | Source: | arXiv, cond-mat/0509522 | Services: | Forum | Review | PDF | Favorites |
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