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20 April 2024

» arxiv » cond-mat/9811141

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Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope
Ashfaq S. Thanawalla ; B. J. Feenstra ; Wensheng Hu ; D. E. Steinhauer ; S. K. Dutta ; Steven M. Anlage ; F. C. Wellstood ; Robert B. Hammond ;
Date:	10 Nov 1998
Journal:	IEEE Trans. Appl. Supercond. 9, 3042 (1999)
Subject:	Superconductivity \| cond-mat.supr-con
Affiliation:	University of Maryland) and Robert B. Hammond (STI Inc.
Abstract:	We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mm inner conductor diameter and operates from 77 to 300 K in the 0.01-20 GHz frequency range. In this paper, we present microwave images of the electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator at 77 K, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the resonant frequency of the device.
Source:	arXiv, cond-mat/9811141
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