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24 April 2024

» arxiv » cond-mat/9811158

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Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope
Steven M. Anlage ; D. E. Steinhauer ; C. P. Vlahacos ; B. J. Feenstra ; A. S. Thanawalla ; Wensheng Hu ; Sudeep K. Dutta ; F. C. Wellstood ;
Date:	11 Nov 1998
Journal:	IEEE Trans. Appl. Supercond. 9, 4127 (1999)
Subject:	Materials Science; Superconductivity \| cond-mat.mtrl-sci cond-mat.supr-con
Affiliation:	University of Maryland
Abstract:	We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $mu$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
Source:	arXiv, cond-mat/9811158
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