Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'504'585
Articles rated: 2609

24 April 2024
 
  » arxiv » cond-mat/0002429

 Article overview



Critical neutron scattering study of the compositional phase transition in Mg-doped CuGeO3
M. Nishi ; H. Nakao ; Y. Fujii ; T. Masuda ; K. Uchinokura ; G. Shirane ;
Date 28 Feb 2000
Subject Strongly Correlated Electrons; Materials Science | cond-mat.str-el cond-mat.mtrl-sci
AbstractCu1-xMgxGeO3 undergoes a first-order phase transition at a critical concentration xc between an antiferromagnetic (AF) state on dimerized lattice (D-AF) and an AF Neel state on undistorted uniform lattice (U-AF). Previous magnetic susceptibility measurements showed xc = 0.023 while a recent neutron scattering study reported xc = 0.027 +- 0.001. The present critical scattering due to antiferromagnetic fluctuations near the superlattice reflection (0,1,1/2) unambiguously determines xc = 0.028 +- 0.001 at TN = 3.4 ~ 4 K. Also at T = 1.3 K, the phase boundary was determined as xc = 0.028 +- 0.001 by observation of a jump of an effective magnetic moment across xc.
Source arXiv, cond-mat/0002429
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica