Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'503'724
Articles rated: 2609

23 April 2024
 
  » arxiv » cond-mat/0010103

 Article overview


Generalized conductance sum rule in atomic break junctions
S. Kirchner ; J. Kroha ; E. Scheer ;
Date 6 Oct 2000
Journal in "Kondo Effect and dephasing in low-dimensional metallic systems", NATO Science Series II, vol. 50, 215 (Kluwer Academic Publishers, 2001)
Subject Mesoscopic Systems and Quantum Hall Effect | cond-mat.mes-hall
Affiliation Univ. Karlsruhe, Univ. Konstanz, Germany
AbstractWhen an atomic-size break junction is mechanically stretched, the total conductance of the contact remains approximately constant over a wide range of elongations, although at the same time the transmissions of the individual channels (valence orbitals of the junction atom) undergo strong variations. We propose a microscopic explanation of this phenomenon, based on Coulomb correlation effects between electrons in valence orbitals of the junction atom. The resulting approximate conductance quantization is closely related to the Friedel sum rule.
Source arXiv, cond-mat/0010103
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica