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29 November 2021
  » arxiv » cond-mat/0602182

 Article overview

Magnetic & Chemical Non-Uniformity in Ga[1-x]Mn[x]As as Probed with Neutron & X-Ray Reflectometry
B.J. Kirby ; J.A. Borchers ; J.J. Rhyne ; K.V. O’Donovan ; S.G.E. te Velthuis ; S. Roy ; Cecilia Sanchez-Hanke ; T. Wojtowicz ; X. Liu ; W.L. Lim ; M. Dobrowolska ; J.K. Furdyna ;
Date 7 Feb 2006
Subject Materials Science
AbstractWe report on annealing dependent phenomena in Ga[1-x]Mn[x]As films, as examined using polarized neutron and x-ray reflectometry. Measurements were performed on three sets of as-grown and optimally annealed Ga[1-x]Mn[x]As thin film pairs. For two of the sets, annealing is observed to smooth pronounced magnetization gradients, and alter the films’ surface chemical composition. The third set is different, as it is found to have a higher as-grown Curie temperature, features no detectable magnetization gradient (as-grown or annealed), and annealing does not alter the surface chemical composition as drastically as for the other two sets. Our results demonstrate the effects of annealing on the Ga[1-x]Mn[x]As depth profile, and suggest that the depth profile is very sensitive to growth conditions. Furthermore, this work illustrates how polarized neutron reflectometry can be used to measure the magnetic depth profiles of extremely dilute magnetic thin films (M < 50 emu/cm^-3).
Source arXiv, cond-mat/0602182
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