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Hybrid reciprocal space for X-ray diffraction in epitaxial layers | | Jarek Z. Domagala
; Sergio L. Morelhao
; | | Date: |
9 Nov 2006 | | Subject: | Materials Science | | Abstract: | Even after several decades of systematic usage of x-ray diffraction as one of the major analytical tool for epitaxial layers, the vision of the reciprocal space of these materials is still a simple superposition of two reciprocal lattices, one from the substrate and another from layer. In this work, the general theory accounting for hybrid reflections in the reciprocal space of layer/substrate systems is presented. It allows a deep insight on how complex such reciprocal space is in fact, and how many interesting properties it has. Properties that can be exploited even on commercial diffractometers, leading to different, very detailed, and comprehensive analysis of such materials. | | Source: | arXiv, cond-mat/0611262 | | Services: | Forum | Review | PDF | Favorites | |
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