Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'503'724
Articles rated: 2609

23 April 2024
 
  » arxiv » astro-ph/0702200

 Article overview


X-Ray Spectral Variability in Initial Rise of XTE J1550-564
Y. X. Wu ; C. Z. Liu ; T. P. Li ;
Date 7 Feb 2007
AbstractX-ray variability of the microquasar XTE J1550-564 is studied with time domain techniques for the data from the RXTE/PCA observation in September 8, 1998. The 2--60 keV averaged shot is obtained from superposing shots with one millisecond time bin through aligning their peaks. The spectral behavior during the averaged shot exhibits prominent differences from that observed in Cyg X-1. The hardness ratio of (13--60 keV)/(2--13 keV) or (16--60 keV)/(13--16 keV) during a shot is lower or higher than that of steady emission respectively. The correlation coefficient between intensity and hardness ratio of (13--60 keV)/(2--13 keV) or (16--60 keV)/(13--16 keV) is negative or positive respectively. These results may indicate that physical processes in the low state of XTE J1550-564 are different from those in Cyg X-1.
Source arXiv, astro-ph/0702200
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica