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24 April 2024 |
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Feedback controlled electromigration in four-terminal nano-junctions | | Zheng-Ming Wu
; Michael Steinacher
; Roman Huber
; Michel Calame
; Sense Jan van der Molen
; Christian Schonenberger
; | | Date: |
25 Mar 2007 | | Subject: | Mesoscopic Systems and Quantum Hall Effect | | Abstract: | We have developed a fast, yet highly reproducible method to fabricate metallic electrodes with nanometer separation using electromigration (EM). We employ four-terminal instead of two-terminal devices in combination with an analog feedback to maintain the voltage $U$ over the junction constant. After the initialization phase ($U < 0.2V), during which the temperature $T$ increases by 80-150 degs C, EM sets in shrinking the wire locally. This quickly leads to a transition from the diffusive to a quasi-ballistic regime ($0.2V < U < 0.6V). At the end of this second regime, a gap forms (U > 0.6V). Remarkably, controlled electromigration is still possible in the quasi-ballistic regime. | | Source: | arXiv, cond-mat/0703649 | | Services: | Forum | Review | PDF | Favorites | |
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