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14 October 2024
 
  » arxiv » 2206.00190

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Predicted universality class of step bunching found on DC-heated Si(111) surfaces
Alexey Kozlov ; Alexander Samardak ; Nikolay Chernousov ; Hristina Popova ; Magdalena A. Zaluska-Kotur ; Alberto Pimpinelli ; Vesselin Tonchev ;
Date 1 Jun 2022
AbstractConcerted experimental and numerical studies of step bunching on vicinal crystal surfaces resulting from step-down electromigration of partially charged adatoms, confirmed the theoretical prediction of scaling dependence of the minimal bunch distance $l_{ m min}$ on the bunch size $N$: $l_{ m min} sim N^{-gamma}$, with $gamma = 2/3$. The value of the so called size-scaling exponent $gamma$ was observed in experiments on vicinal surfaces of semiconducting, metallic, and dielectric materials. Careful theoretical investigations and numerical calculations predict a second value of $gamma = 1/2$. However, this value is still not been reported from experiments. And we report here experimental observation of step bunching in the universality class relative to $gamma = 1/2$. This is achieved by monitoring step flow during sublimation of Si(111)-vicinals heated by a direct step-down current at ~1200$^circ$C. In the experiment we also measure other characteristic for the bunching quantities, such as the mean total number of steps in the bunch $N$ and the mean bunch width $W$. We then compare our findings with published experimental and numerical data to arrive at a theoretically consistent framework in terms of universality classes. The ultimate benefit of our study is not only to advance fundamental knowledge but also to provide further guidance for bottom-up synthesis of vicinal nanotemplates.
Source arXiv, 2206.00190
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