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25 January 2025

» arxiv » 2301.00456

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Characteristic lengthscales of the electrically-induced insulator-to-metal transition
Theodor Luibrand ; Adrien Bercher ; Rodolfo Rocco ; Farnaz Tahouni-Bonab ; Lucia Varbaro ; Carl Willem Rischau ; Claribel Domínguez ; Yixi Zhou ; Weiwei Luo ; Soumen Bag ; Lorenzo Fratino ; Reinhold Kleiner ; Stefano Gariglio ; Dieter Koelle ; Jean-Marc Triscone ; Marcelo J. Rozenberg ; Alexey B. Kuzmenko ; Stefan Guénon ; Javier del Valle ;
Date:	1 Jan 2023
Abstract:	Some correlated materials display an insulator-to-metal transition as the temperature is increased. In most cases this transition can also be induced electrically, resulting in volatile resistive switching due to the formation of a conducting filament. While this phenomenon has attracted much attention due to potential applications, many fundamental questions remain unaddressed. One of them is its characteristic lengths: what sets the size of these filaments, and how does this impact resistive switching properties. Here we use a combination of wide-field and scattering-type scanning near-field optical microscopies to characterize filament formation in NdNiO3 and SmNiO3 thin films. We find a clear trend: smaller filaments increase the current density, yielding sharper switching and a larger resistive drop. With the aid of numerical simulations, we discuss the parameters controlling the filament width and, hence, the switching properties.
Source:	arXiv, 2301.00456
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