Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3665
Articles: 2'599'751
Articles rated: 2609

20 January 2025
 
  » arxiv » 2309.00225

 Article overview



Rapid single-shot parity spin readout in a silicon double quantum dot with fidelity exceeding 99 %
Kenta Takeda ; Akito Noiri ; Takashi Nakajima ; Leon C. Camenzind ; Takashi Kobayashi ; Amir Sammak ; Giordano Scappucci ; Seigo Tarucha ;
Date 1 Sep 2023
AbstractSilicon-based spin qubits offer a potential pathway toward realizing a scalable quantum computer owing to their compatibility with semiconductor manufacturing technologies. Recent experiments in this system have demonstrated crucial technologies, including high-fidelity quantum gates and multiqubit operation. However, the realization of a fault-tolerant quantum computer requires a high-fidelity spin measurement faster than decoherence. To address this challenge, we characterize and optimize the initialization and measurement procedures using the parity-mode Pauli spin blockade technique. Here, we demonstrate a rapid (with a duration of a few us) and accurate (with >99% fidelity) parity spin measurement in a silicon double quantum dot. These results represent a significant step forward toward implementing measurement-based quantum error correction in silicon.
Source arXiv, 2309.00225
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.






ScienXe.org
» my Online CV
» Free

home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2025 - Scimetrica