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25 January 2025

» arxiv » cond-mat/0701455

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Probing pairing symmetry of Sm_{1.85}Ce_{0.15}CuO_4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering
A.J.C. Lanfredi ; S. Sergeenkov ; F.M. Araujo-Moreira ; 10.1016/j.physleta.2006.07.010 ;
Date:	18 Jan 2007
Journal:	Physics Letters A 359, 696 (2006)
Subject:	Superconductivity; Materials Science
Abstract:	Using a highly-sensitive home-made mutual-inductance technique, temperature profiles of the magnetic penetration depth $lambda (T)$ in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films have been extracted. The low-temperature behavior of $lambda (T)$ is found to be best-fitted by linear $Delta lambda (T)/lambda (0)= ln(2)k_BT/Delta_0$ and quadratic $Delta lambda (T)/lambda (0)=Gamma ^{-1/2}Delta_0^{-3/2}T^2$ laws above and below $T=0.22T_C$, respectively, which clearly indicates the presence of d-wave pairing mechanism dominated by strong paramagnetic scattering at the lowest temperatures. The best fits produce $Delta_0/k_BT_C=2.07$ and $Gamma /T_C=0.25(T_C/Delta_0)^3$ for the estimates of the nodal gap parameter and impurity scattering rate.
Source:	arXiv, cond-mat/0701455
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