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18 January 2025
 
  » arxiv » cond-mat/0701462

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Use of real-time Fourier Transform Infrared Reflectivity as an in situ monitor of YBCO film growth and processing
Gertjan Koster ; Jeong-Uk Huh ; R.H. Hammond ; M.R. Beasley ;
Date 18 Jan 2007
Subject Materials Science; Superconductivity
AbstractFourier Transform Infrared (FTIR) spectroscopy has been utilized during high rate E-beam evaporation/deposition of YBa2Cu3O7 (YBCO). The results demonstrate the great utility of FTIR as an in situ monitor of YBCO deposition and processing. We detect different (amorphous/fine polycrystalline) insulating pre-existing phases to the high Tc superconducting phase which appear to have distinct reflectivity fingerprints dominated by thin film interference effects, as a function of temperature and oxygen pressure. These fingerprints reveal some of the kinetic and thermodynamic pathways during the growth of YBCO.
Source arXiv, cond-mat/0701462
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