Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3662
Articles: 2'599'751
Articles rated: 2609

14 December 2024
 
  » arxiv » cond-mat/9710210

 Article overview



Strain-induced shift in the elastically soft direction of epitaxially grown fcc metals
V. Ozolins ; C. Wolverton ; A. Zunger ;
Date 21 Oct 1997
Subject Materials Science | cond-mat.mtrl-sci
AbstractThe theory of epitaxial strain energy is extended beyond the harmonic approximation to account for large film/substrate lattice mismatch. We find that for fcc noble metals (i) directions <001> and <111> soften under tensile biaxial strain (unlike zincblende semiconductors) while (ii) <110> and <201> soften under compressive biaxial strain. Consequently, (iii) upon sufficient compression <201> becomes the softest direction (lowest elastic energy), but (iv) <110> is the hardest direction for large tensile strain. (v) The dramatic softening of <001> in fcc noble metals upon biaxial tensile strain is caused by small fcc/bcc energy differences for these materials. These results can be used in selecting the substrate orientation for effective epitaxial growth of pure elements and A/sub p/B/sub q/ superlattices, as well as to explain the shapes of coherent precipitates in phase separating alloys.
Source arXiv, cond-mat/9710210
Services Forum | Review | PDF | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.






ScienXe.org
» my Online CV
» Free

home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica