Science-advisor
REGISTER info/FAQ
Login
username
password
     
forgot password?
register here
 
Research articles
  search articles
  reviews guidelines
  reviews
  articles index
My Pages
my alerts
  my messages
  my reviews
  my favorites
 
 
Stat
Members: 3645
Articles: 2'506'133
Articles rated: 2609

26 April 2024
 
  » pubmed » pmid12857214

 Article overview



Distribution of voltage fluctuations in a current-biased conductor
M Kindermann ; Yu V Nazarov ; C W J Beenakker ;
Date 20 Jun 2003
Journal Phys Rev Lett, 90 (24), 246805
AbstractWe calculate the fluctuating voltage V(t) over a conductor driven out of equilibrium by a current source. This is the dual of the shot noise problem of current fluctuations I(t) in a voltage-biased circuit. In the single-channel case the distribution of the accumulated phase Phi=(e/ variant Planck’s over 2pi ) integral Vdt is the Pascal (or binomial waiting-time) distribution-distinct from the binomial distribution of transferred charge Q= integral Idt. The weak-coupling limit of a Poissonian P(Phi) is reached in the limit of a ballistic conductor, while in the tunneling limit P(Phi) has the chi-square form.
Source PubMed, pmid12857214
Services Forum | Review | Favorites   
 
Visitor rating: did you like this article? no 1   2   3   4   5   yes

No review found.
 Did you like this article?

This article or document is ...
important:
of broad interest:
readable:
new:
correct:
Global appreciation:

  Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.

browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)






ScienXe.org
» my Online CV
» Free


News, job offers and information for researchers and scientists:
home  |  contact  |  terms of use  |  sitemap
Copyright © 2005-2024 - Scimetrica