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Observation of photon-assisted noise in a diffusive normal metal-superconductor junction | A A Kozhevnikov
; R J Schoelkopf
; D E Prober
; | Date: |
10 Apr 2000 | Journal: | Phys Rev Lett, 84 (15), 3398-401 | Abstract: | We report measurements of nonequilibrium noise in a diffusive normal metal-superconductor (N-S) junction in the presence of both dc bias and high-frequency ac excitation. We find that the shot noise of a diffusive N-S junction is doubled compared to a normal diffusive conductor. Under ac excitation of frequency nu the shot noise develops features at bias voltages |V| = hnu/(2e), which bear all the hallmarks of a photon-assisted process. Observation of these features provides clear evidence that the effective charge of the current carriers is 2e, due to Andreev reflection. | Source: | PubMed, pmid11019099 | Services: | Forum | Review | Favorites |
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