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27 April 2024

» arxiv » 0802.0867

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X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced N'eel-cap reversal
Fabien Cheynis ; Nicolas Rougemaille ; Rachid Belkhou ; Jean-Christophe Toussaint ; Olivier Fruchart ;
Date:	6 Feb 2008
Abstract:	X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on N’eel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of N’eel-cap magnetization give clear evidence for the magnetization reversal of the N’eel caps around 120 mT, with a $pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.
Source:	arXiv, 0802.0867
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