|
| | | | |
| | | |
| Stat |
Members: 3645
Articles: 2'504'928
Articles rated: 2609
26 April 2024 |
|
| | | | |
|
Article overview
| |
|
|
Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced DC-magnetic field sensitivity | | A. Dréau
; M. Lesik
; L. Rondin
; P. Spinicelli
; O. Arcizet
; J.-F. Roch
; V. Jacques
; | | Date: |
31 Jul 2011 | | Abstract: | We report a systematic study of the magnetic field sensitivity of a magnetic
sensor based on a single Nitrogen-Vacancy (NV) defect in diamond, by using
continuous optically detected electron spin resonance (ESR) spectroscopy. We
first investigate the behavior of the ESR contrast and linewidth as a function
of the microwave and optical pumping power. The experimental results are in
good agreement with a simplified model of the NV defect spin dynamics, yielding
to an optimized sensitivity around 2 mu T/sqrt{
m Hz}. We then demonstrate
an enhancement of the magnetic sensitivity by one order of magnitude by using a
simple pulsed-ESR scheme. This technique is based on repetitive excitation of
the NV defect with a resonant microwave pi-pulse followed by an optimized
read-out laser pulse, allowing to fully eliminate power broadening of the ESR
linewidth. The achieved sensitivity is similar to the one obtained by using
Ramsey-type sequences, which is the optimal magnetic field sensitivity for the
detection of DC magnetic fields. | | Source: | arXiv, 1108.0178 | | Services: | Forum | Review | PDF | Favorites | |
|
|
No review found.
Did you like this article?
Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.
browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)
|
| |
|
|
|
|
News, job offers and information for researchers and scientists:
| |
REGISTER