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26 April 2024

» arxiv » 1604.8493

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New Limits on Double Electron Capture of 40Ca and 180W
G. Angloher ; M. Bauer ; P. Bauer ; I. Bavykina ; A. Bento ; C. Bucci ; L. Canonica ; C. Ciemniak ; X. Defay ; G. Deuter ; A. Erb ; F. v. Feilitzsch ; N. Ferreiro Iachellini ; P. Gorla ; A. Gütlein ; D. Hauff ; P. Huff ; C. Isaila ; J. Jochum ; M. Kiefer ; M. Kimmerle ; H. Kluck ; H. Kraus ; J.-C. Lanfranchi ; J. Loebell ; A Münster ; C. Pagliarone ; F. Petricca ; S. Pfister ; W. Potzel ; F. Pröbst ; F. Reindl ; S. Roth ; K. Rottler ; C. Sailer ; K. Schäffner ; J. Schieck ; J. Schmaler ; S. Scholl ; S. Schönert ; W. Seidel ; M. v. Sivers ; L. Stodolsky ; C. Strandhagen ; R. Strauss ; A. Tanzke ; V. Tretyak ; H. H. Trinh Thi ; C. Türkoğlu ; M. Uffinger ; A. Ulrich ; I. Usherov ; S. Wawoczny ; M. Willers ; M. Wüstrich ; A. Zöller ;
Date:	28 Apr 2016
Abstract:	We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40Ca with T1/2 2v2K >9.9x10^21 y and T1/2 0v2EC >1.4x10^22 y and for 180W with T1/2 2v2K >3.1x10^19 y and T1/2 0v2EC >9.4x10^18 y at 90% CL. These values improve the currently best limits by up to a factor of ~30.
Source:	arXiv, 1604.8493
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