|
| | | | |
| | | |
| Stat |
Members: 3645
Articles: 2'506'133
Articles rated: 2609
26 April 2024 |
|
| | | | |
|
Article overview
| |
|
|
Thin-Film Aluminum Microstructure as a Hot-Electron Microwave Radiation Detector | | I. Yu. Borisenko
; V. I. Kuznetsov
; V. A. Tulin
; D. Esteve
; | | Date: |
23 Jul 2004 | | Journal: | J. Low Temp. Phys. 119, 483 (2000) [Special Issue: The Second International Chernogolovka Workshop on Low Temperature Physics in Microgravity Environment, CWS’99, July 28-August 2, 1999, Chernogolovka, Russia] | | Subject: | Superconductivity; Mesoscopic Systems and Quantum Hall Effect | cond-mat.supr-con cond-mat.mes-hall | | Abstract: | We have found that the thin film aluminum structures shaped into a chain of micron sized islands connected by narrow isthmuses, can modify their electrical and structural properties under microwave radiation. As a result, at the temperature of 4.2 K the film structures turn into a kind of lateral periodic structure N-S-N, where N is for normal islands, S is for superconducting isthmuses. Current-voltage characteristics of the samples, as well as changes of these characteristics under low power radiation, have been studied over the temperature range from 1.3 to 10 K. The sensitivity of a structure as a microwave detector runs 10^{5} V/W. | | Source: | arXiv, cond-mat/0407636 | | Services: | Forum | Review | PDF | Favorites | |
|
|
No review found.
Did you like this article?
Note: answers to reviews or questions about the article must be posted in the forum section.
Authors are not allowed to review their own article. They can use the forum section.
browser Mozilla/5.0 AppleWebKit/537.36 (KHTML, like Gecko; compatible; ClaudeBot/1.0; +claudebot@anthropic.com)
|
| |
|
|
|
|
News, job offers and information for researchers and scientists:
| |
REGISTER