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High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated scanning transmission electron microscopy | | Victor Boureau
; Michal Staňo
; Jean-Luc Rouvière
; Jean-Christophe Toussaint
; Olivier Fruchart
; and David Cooper
; | | Date: |
21 Aug 2020 | | Abstract: | We compare two transmission electron microscopy (TEM) based techniques that
can provide highly spatially resolved quantitative measurements of magnetic
induction fields at high sensitivity. To this end, the magnetic induction of a
ferromagnetic NiFe nanowire has been measured and compared to micromagnetic
modelling. State-of-the-art electron holography has been performed using the
averaging of large series of holograms to improve the sensitivity of the
measurements. These results are then compared those obtained from pixelated (or
4D) scanning transmission electron microscopy (STEM). This emerging technique
uses a pixelated detector to image the local diffraction patterns as the beam
is scanned over the sample. For each diffraction pattern, the deflection of the
beam is measured and converted into magnetic induction, while scanning the beam
allows to build a map. Aberration corrected Lorentz (field-free) configurations
of the TEM and STEM were used for an improved spatial resolution. We show that
the pixelated STEM approach, even when performed using an old generation of
charge-coupled device camera, provides better sensitivity at the expense of
spatial resolution. A more general comparison of the two techniques is given. | | Source: | arXiv, 2008.09308 | | Services: | Forum | Review | PDF | Favorites | |
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