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Article overview
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Noise-assisted Mound Coarsening in Epitaxial Growth | L.-H. Tang
; P. Smilauer
; D. D. Vvedensky
; | Date: |
6 Mar 1997 | Subject: | Materials Science; Statistical Mechanics | cond-mat.mtrl-sci cond-mat.stat-mech | Affiliation: | HK Baptist U), P. Smilauer, and D. D. Vvedensky (Imperial College, UK | Abstract: | We propose deposition noise to be an important factor in unstable epitaxial growth of thin films. Our analysis yields a geometrical relation H=(RWL)^2 between the typical mound height W, mound size L, and the film thickness H. Simulations of realistic systems show that the parameter R is a characteristic of the growth conditions, and generally lies in the range 0.2-0.7. The constancy of R in late-stage coarsening yields a scaling relation between the coarsening exponent 1/z and the mound height exponent eta which, in the case of saturated mound slope, gives eta = 1/z = 1/4. | Source: | arXiv, cond-mat/9703056 | Services: | Forum | Review | PDF | Favorites |
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