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26 April 2024
 
  » arxiv » cond-mat/9703056

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Noise-assisted Mound Coarsening in Epitaxial Growth
L.-H. Tang ; P. Smilauer ; D. D. Vvedensky ;
Date 6 Mar 1997
Subject Materials Science; Statistical Mechanics | cond-mat.mtrl-sci cond-mat.stat-mech
AffiliationHK Baptist U), P. Smilauer, and D. D. Vvedensky (Imperial College, UK
AbstractWe propose deposition noise to be an important factor in unstable epitaxial growth of thin films. Our analysis yields a geometrical relation H=(RWL)^2 between the typical mound height W, mound size L, and the film thickness H. Simulations of realistic systems show that the parameter R is a characteristic of the growth conditions, and generally lies in the range 0.2-0.7. The constancy of R in late-stage coarsening yields a scaling relation between the coarsening exponent 1/z and the mound height exponent eta which, in the case of saturated mound slope, gives eta = 1/z = 1/4.
Source arXiv, cond-mat/9703056
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